Readme.txt - Summary of data in repository for: Dataset for Skin-deep Patterning of Calcite Repository author: David C. Green, ORCID:0000-0002-0578-2369, email: chmdcg@leeds.ac.uk Compiled 28th August 2019 File name and contents: SEM_raw.zip - SEM micrographs in tif format of crystals produced under the conditions described. Confocal_raw.zip - Raw confocal data, format usable in ImageJ Raman_raw.zip - Raw raman spectroscopy data openable in excel and Renishaw's Wire software package. TEM_raw.zip - TEM micrographs of nanoshoots, openable in ImageJ or equivalent (i.e. FIJI) Optical_raw.zip - OPtical micrographs which are openable in any image editing software FIB_raw.zip - SEM micrographs in tif format - CDM300cp20k (CDM grown calcite in the presence of 300uL stock cp20k solution) Mg05300cp20k (Calcite grown with Mg/Ca = 0.5 and 300 uL stock cp20k solution byt CDM or ADM) Optical and polarised light microscopy (PLM) Light microscopy and PLM was conducted on calcite samples grown on glass substrates with Nikon Eclipse LV100 microscope controlled with NIS-Elements BR software. Micrographs were captured digitally used Nikon DS-Fi1/Nikon Digital Sight CCD camera. Raman microscopy Raman microscopy was conducted on calcite samples grown on glass substrates using a Renishaw inVia Raman Microscope (785 nm laser) with a 50x objective using MS20 encoded sample stage control through rollerball XYZ peripheral. Data acquisition was undertaken with Renishaw WiRE 3.4 with a laser intensity of 0.1% under 3 accumulated acquisitions (3 x scan time 30 s) between 1200 to 100 cm-1. Scanning electron microscopy (SEM) SEM was conducted on FEI NanoSEM Nova 450 from samples grown directly on clean glass substrates. Samples were mounted on aluminium stubs with double sided Cu tape, with tape folded to a portion of the top surface of the substrate to minimise charging. All samples were coated with 2 nm Ir conductive layer prior to analysis. Transmission electron microscopy (TEM) TEM was conducted on FEI Tecnai TF20 FEG-TEM fitted with an Oxford Instruments INCA 350 EDX system/80mm X-Max SDD detector and a Gatan Orius SC600A CCD camera operating at 200?kV. Samples were loaded onto carbon coated Cu grids. Focussed ion beam (FIB) lithography FIB lithography was conducted on FEI Dual Beam system equipped with a 30?kV?Ga beam and a field emission electron gun (FEG) operated at 5kV. Confocal laser fluorescence microscopy (CLFM) Confocal laser fluorescence microscopy was conducted on Zeiss LSM510 Upright Confocal Microscope using samples grown directly on clean glass substrates under oil immersion where required. Laser and imaging settings were controlled with Zeiss ZEN software, where preset conditions for FITC were used (excitation at 488 nm, low pass emission filter at 505 nm). Image analysis For all confocal fluorescence, optical, polarised light, TEM and SEM micrographs; rendering and analysis was conducted in ImageJ. For confocal fluorescence microscope z-stacks, optical images were taken from the central most plane. Fluorescence confocal micrographs were obtained by forming a z-projection for z-stacks. Surface images, as viewed from various angles, were obtained by rendering confocal fluorescence z-stacks into 3D, and rotating the rendered image manually. Orthogonal views images were obtained using orthogonal views option, where each plane. was selected to best represent the surface and internal structure of each sample. Aspect ratio measurements were obtained from low magnification SEM. Calcite morphology modelling Calcite models were drawn using WinXMorph software.