Read me for Dataset associated with 'Sub-micron Diffractive Optical Elements Facilitated by Intrinsic Deswelling of Auxetic Liquid Crystal Elastomers'

File list:
Read_me.txt
Figure 2.xlsx
Figure 3.xlsx
Figure 4.xlsx
Figure 5.xlsx
Figure 6.xlsx
Figure 7.xlsx

Content:
Figure 2.xlsx
X_IPI (um) - X scan AFM data for imprinted polyimide substrate (micro meters)
Y_IPI (nm) - Y scan AFM data for imprinted polyimide substrate (nano meters)
X_n_para (um) - X scan AFM data for n_para LCE (micro meters)
Y_n_para (nm) - Y scan AFM data for n_para LCE (nano meters)
X_n_perp (um) - X scan AFM data for n_perp LCE (micro meters)
Y_n_perp (nm) - Y scan AFM data for n_perp LCE (nano meters)

Figure 3.xlsx
X_n_para_45.7%_6OCB (um) - X scan AFM data for 45.7% 6OCB n_para LCE sample (micro meters)
Y_n_para_45.7%_6OCB (nm) - Y scan AFM data for 45.7% 6OCB n_para LCE sample (nano meters)
X_n_para_54.6%_6OCB (um) - X scan AFM data for 54.6% 6OCB n_para LCE sample (micro meters)
Y_n_para_54.6%_6OCB (nm) - Y scan AFM data for 54.6% 6OCB n_para LCE sample (nano meters)
X_n_para_64.4%_6OCB (um) - X scan AFM data for 64.4% 6OCB n_para LCE sample (micro meters)
Y_n_para_64.4%_6OCB (nm) - Y scan AFM data for 64.4% 6OCB n_para LCE sample (nano meters)
X_n_para_70.7%_6OCB (um) - X scan AFM data for 70.7% 6OCB n_para LCE sample (micro meters)
Y_n_para_70.7%_6OCB (nm) - Y scan AFM data for 70.7% 6OCB n_para LCE sample (nano meters)

mol% of 6OCB - concentration of sample
Pitch (nm) - pitch of n_para LCE samples with various concentrations of 6OCB (nano meters)
err - errors
Height (nm) - feature height of n_para LCE samples with various concentrations of 6OCB (nano meters)
err - errors

Figure 4.xlsx
Temp (deg_C) - Temperature
Change in pitch n_para (%) - change in pitch of n_para LCEs (%)
err - errors
Change in pitch n_perp (%) - change in pitch of n_perp LCEs (%)
err - errors
Change in pitch isotropic (%) - change in pitch of isotropic LCEs (%)

Figure 5.xlsx
Strain - strain applied to n_para LCE
err - errors
Pitch diffraction (nm) - pitch of strained n_para LCE from diffraction measurements (nano meters)
err - errors

Strain - strain applied to n_para LCE
err - errors
Pitch AFM (nm) - pitch of strained n_para LCE from AFM measurements (nano meters)
Fractional height (%) - change in surface feature height under applied strain (%)
err - errors

X_AFM_0_strain (um) - X scan AFM data for n_para LCE sample unstrained (micro meters)
Y_AFM_0_strain (nm) - Y scan AFM data for n_para LCE sample unstrained (nano meters)
X_AFM_0.41_strain (um) - X scan AFM data for n_para LCE sample under strain of 0.41 (micro meters)
Y_AFM_0.41_strain (nm) - Y scan AFM data for n_para LCE sample under strain of 0.41 (nano meters)
X_AFM_1.46_strain (um) - X scan AFM data for n_para LCE sample under strain of 1.46 (micro meters)
Y_AFM_1.46_strain (nm) - Y scan AFM data for n_para LCE sample under strain of 1.46 (nano meters)

Figure 6.xlsx
Strain - strain applied to n_para LCE
err - errors
diffraction efficiency n_para strain (%) - 1st order diffraction efficiency of strained n_para LCE (%)
err - errors

Temp (deg_C) - temperature of n_para LCE
diffraction efficiency n_para temp (%) - 1st order diffraction efficiency of n_para LCE at various temperatures (%)
err - errors

Temp (deg_C) - temperature of n_perp LCE
diffraction efficiency n_perp temp (%) - 1st order diffraction efficiency of n_perp LCE at various temperatures (%)
err - errors

Figure 7.xlsx
X_n_para (um) - X scan AFM data for n_para LCE (micro meters)
Y_n_para (nm) - Y scan AFM data for n_para LCE (nano meters)
X_n_para_post_temp (um) - X scan AFM data for n_para LCE after heated to 240 deg_C (micro meters)
Y_n_para_post_temp (nm) - Y scan AFM data for n_para LCE after heated to 240 deg_C (nano meters)
X_n_para_post_strain (um) - X scan AFM data for n_para LCE after straining to 1.56 (micro meters)
Y_n_para_post_strain (nm) - Y scan AFM data for n_para LCE after straining to 1.56 (nano meters)
X_n_perp (um) - X scan AFM data for n_perp LCE (micro meters)
Y_n_perp (nm) - Y scan AFM data for n_perp LCE (nano meters)
X_n_perp_post_temp (um) - X scan AFM data for n_perp LCE after heated to 240 deg_C (micro meters)
Y_n_perp_post_temp (nm) - Y scan AFM data for n_perp LCE after heated to 240 deg_C (nano meters)